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Criterion
Paper illustration for Fault Tree Analysis.
Operations
Fault Tree Analysis
Paper illustration of a Test Card with four fields for hypothesis, test, metric, and success threshold.
Product Discovery
Test Card
Paper illustration of DIBB with its method-specific working model.
Product Strategy
DIBB
Purposedifferent
For a critical top event with several possible triggers, the method logically models failure paths. It makes visible which combinations of conditions can lead to damage.The Test Card turns a critical assumption into a testable claim and specifies in advance which result counts as success.DIBB helps clarify target groups, value, goals, and priorities by making the logic behind a decision explicit. It captures results as a DIBB document, belief list, bet list, and learning report.
Complexitydifferent
HighLowLow
Timedifferent
2-6 h20-35 min1-2 h
Participantsdifferent
3-81-52-8
Formatsame
Workshop + asyncWorkshop + asyncWorkshop + async
Outputdifferent
Fault Tree, Critical Paths, Cause Hypotheses, Control ActionsTest Card with a pre-set thresholdDIBB document, Belief list, Bet list, Learning report
Tagsno overlap
RiskRoot causeSafety
ExperimentsValidationDiscoveryHypothesis
StrategyDecisionAssumptionsHypothesis
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Often compared together

Methods with strong topical overlap with the current selection, not yet in the comparison.

Paper illustration of a calm four-quadrant Assumption Map with hypothesis cards and emphasis on important assumptions with little evidence.
Product Discovery
Assumption Mapping
Paper illustration of an assumption matrix with prioritized test cards
Decision Making
Assumption Surfacing
Paper illustration of Experiment Canvas with a method-specific labelled workspace.
Product Discovery
Experiment Canvas
Paper illustration of Riskiest Assumption Test with a method-specific labelled workspace.
Product Discovery
Riskiest Assumption Test