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| Criterion |  Operations Fault Tree Analysis |  Product Discovery Test Card |  Innovation Design Sprint |
|---|---|---|---|
Purposedifferent | For a critical top event with several possible triggers, the method logically models failure paths. It makes visible which combinations of conditions can lead to damage. | The Test Card turns a critical assumption into a testable claim and specifies in advance which result counts as success. | When the product question is unclear and time pressure is high, the method takes a team from an open idea to a testable solution. It connects problem understanding, decision, and learning in one compact format, lowering the risk of spending a lot of energy on a mere guess. |
Complexitydifferent | High | Low | High |
Timedifferent | 2-6 h | 20-35 min | 4-5 Tage |
Participantsdifferent | 3-8 | 1-5 | 5-8 |
Formatdifferent | Workshop + async | Workshop + async | Workshop |
Outputdifferent | Fault Tree, Critical Paths, Cause Hypotheses, Control Actions | Test Card with a pre-set threshold | Prototype, Test Findings, Decision Rationale |
Tagsno overlap | RiskRoot causeSafety | ExperimentsValidationDiscoveryHypothesis | Design sprintPrototypeValidationInnovation |
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Methods with strong topical overlap with the current selection, not yet in the comparison.
