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Criterion
Paper illustration for Fault Isolation.
Engineering
Fault Isolation
Design sheets and interface cards connect to jointly written pseudocode with highlighted unresolved questions.
Architecture
ARID (Active Reviews for Intermediate Designs)
Paper illustration of a Learning Card with four fields for hypothesis, observation, insight, and action.
Product Discovery
Learning Card
Purposedifferent
In technical failures, the visible symptom often gets mixed up with the actual cause. Fault Isolation narrows the fault space and progressively reduces which part of the system is truly affected.ARID examines how well developers can work with a technical design. It focuses on a part of the system that can still be revised, between the architecture overview and the detailed specification.The Learning Card connects traceable test results to a reasoned next action while keeping the limits of the insight visible.
Complexitydifferent
MediumMediumLow
Timedifferent
30-180 min2–4 h review as a planning range; preparation and evaluation additional25-40 min
Participantsdifferent
1-6Designers, developers as users, and facilitation1-5
Formatsame
Workshop + asyncWorkshop + asyncWorkshop + async
Outputdifferent
Fault Isolation Map, Test Log, Excluded Hypotheses, Narrowed Fault AreaPrioritized development tasks, Jointly produced code or pseudocode, Observed difficulties and open design questions, Proposed design revisionsLearning Card with evidence and next action
Tagsno overlap
TroubleshootingDiagnosisEngineering
ArchitectureEngineeringFeedbackValidationTasks
ExperimentsValidationDiscoveryLearning
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Often compared together

Methods with strong topical overlap with the current selection, not yet in the comparison.

Paper illustration of Experiment Canvas with a method-specific labelled workspace.
Product Discovery
Experiment Canvas
Paper illustration for Fake Door Test
Product Discovery
Fake Door Test
Paper illustration of MVP Test Matrix with a method-specific labelled workspace.
Product Discovery
MVP Test Matrix
Paper illustration of Riskiest Assumption Test with a method-specific labelled workspace.
Product Discovery
Riskiest Assumption Test