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Criterion
Paper illustration of Scatter Diagram with its method-specific working model.
Operations
Scatter Diagram
Paper illustration for Ivy Lee Method
Operations
Ivy Lee Method
Paper illustration for ALPEN Method
Operations
ALPEN Method
Paper illustration for Failure Mode and Effects Analysis
Operations
Failure Mode and Effects Analysis
Purposedifferent
When the question is whether two measures are related, the method makes patterns in the data picture visible. It separates felt correlations from relationships that actually show up in the data.With a restless workday full of too many open items, the method creates radical simplicity. It directs attention to a short sequence instead of a broad, still-open field.With an overloaded day full of too many tasks, a realistic picture of the day emerges. The method connects estimating, deciding, and buffer thinking so planning fits available energy and time.For a process, product, or service with noticeable failure risks, the method assesses possible failure modes in advance. It directs attention to combinations of occurrence, effect, and detectability.
Complexitydifferent
LowLowLowHigh
Timedifferent
30-90 min5-10 min daily10-20 min daily2-6 h
Participantsdifferent
1-4113-10
Formatdifferent
Workshop + asyncAsyncAsyncWorkshop
Outputdifferent
Scatter Plot, Korrelationsnotiz, HypothesenlisteDaily Priority List, Completion NotesDaily Plan, Time Estimates, Review NotesFMEA Table, Risk Priority, Mitigation Actions
Tagsno overlap
Root causeQualityVisualization
PrioritizationProductivityExecution
PlanningTime managementProductivityOperations
RiskQualityOperationsRoot cause
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