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Criterion
Paper illustration for Fault Tree Analysis.
Operations
Fault Tree Analysis
Paper illustration of a Test Card with four fields for hypothesis, test, metric, and success threshold.
Product Discovery
Test Card
A paper-based illustration representing Design Sprint with its core stages and visible working result.
Innovation
Design Sprint
Paper illustration for Fake Door Test
Product Discovery
Fake Door Test
Purposedifferent
For a critical top event with several possible triggers, the method logically models failure paths. It makes visible which combinations of conditions can lead to damage.The Test Card turns a critical assumption into a testable claim and specifies in advance which result counts as success.When the product question is unclear and time pressure is high, the method takes a team from an open idea to a testable solution. It connects problem understanding, decision, and learning in one compact format, lowering the risk of spending a lot of energy on a mere guess.When demand is still unclear, it measures interest in a feature before it is built. It separates real behavior from polite agreement and deliberately keeps build effort small.
Complexitydifferent
HighLowHighMedium
Timedifferent
2-6 h20-35 min4-5 Tage1-5 Tage
Participantsdifferent
3-81-55-8Nutzertraffic
Formatdifferent
Workshop + asyncWorkshop + asyncWorkshopAsync
Outputdifferent
Fault Tree, Critical Paths, Cause Hypotheses, Control ActionsTest Card with a pre-set thresholdPrototype, Test Findings, Decision RationaleClick Data, Interest Signal, Learning Decision
Tagsno overlap
RiskRoot causeSafety
ExperimentsValidationDiscoveryHypothesis
Design sprintPrototypeValidationInnovation
ValidationExperimentsDemandDiscovery
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