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Selected:Fault Tree AnalysisOntology Design PatternsFailure Mode and Effects AnalysisNeOn Methodology
| Criterion |  Operations Fault Tree Analysis |  Knowledge Modeling Ontology Design Patterns |  Operations Failure Mode and Effects Analysis |  Knowledge Modeling NeOn Methodology |
|---|---|---|---|---|
Purposedifferent | For a critical top event with several possible triggers, the method logically models failure paths. It makes visible which combinations of conditions can lead to damage. | Ontology Design Patterns provide reusable building blocks for recurring modeling problems. The method brings structure to the search for clean concepts, relationships, and roles. | For a process, product, or service with noticeable failure risks, the method assesses possible failure modes in advance. It directs attention to combinations of occurrence, effect, and detectability. | The NeOn Methodology structures ontology work as a controlled process with reuse, scenarios, and reviews. It is useful when ontologies should not emerge ad hoc but modularly and reusably. |
Complexitydifferent | High | Medium | High | High |
Timedifferent | 2-6 h | 1-3 h pro Pattern | 2-6 h | Mehrere Wochen bis Monate |
Participantsdifferent | 3-8 | 1-6 | 3-10 | 2-10 |
Formatdifferent | Workshop + async | Workshop + async | Workshop | Workshop + async |
Outputdifferent | Fault Tree, Critical Paths, Cause Hypotheses, Control Actions | Selected Patterns, Adapted Schema Fragments, Pattern Documentation | FMEA Table, Risk Priority, Mitigation Actions | Ontology Requirements Specification, Reuse Plan, Ontology Modules, Evaluation Report |
Tagsno overlap | RiskRoot causeSafety | OntologyPatternsReuseSemanticModeling | RiskQualityOperationsRoot cause | OntologyMethodologyReuseSemanticEngineering |