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Criterion
Paper illustration for Fault Tree Analysis.
Operations
Fault Tree Analysis
Paper illustration of NeOn Methodology with its method-specific working model.
Knowledge Modeling
NeOn Methodology
Paper illustration for Root Cause Analysis.
Operations
Root Cause Analysis
Paper illustration for Failure Mode and Effects Analysis
Operations
Failure Mode and Effects Analysis
Purposedifferent
For a critical top event with several possible triggers, the method logically models failure paths. It makes visible which combinations of conditions can lead to damage.The NeOn Methodology structures ontology work as a controlled process with reuse, scenarios, and reviews. It is useful when ontologies should not emerge ad hoc but modularly and reusably.When a problem keeps recurring and the cause stays unclear, the method exposes the underlying mechanism. It separates symptom, guess, and robust explanation from one another.For a process, product, or service with noticeable failure risks, the method assesses possible failure modes in advance. It directs attention to combinations of occurrence, effect, and detectability.
Complexitydifferent
HighHighMediumHigh
Timedifferent
2-6 hMehrere Wochen bis Monate1-4 h2-6 h
Participantsdifferent
3-82-103-83-10
Formatdifferent
Workshop + asyncWorkshop + asyncWorkshop + asyncWorkshop
Outputdifferent
Fault Tree, Critical Paths, Cause Hypotheses, Control ActionsOntology Requirements Specification, Reuse Plan, Ontology Modules, Evaluation ReportProblem Statement, Cause Hypotheses, Confirmed Causes, Action PlanFMEA Table, Risk Priority, Mitigation Actions
Tagsno overlap
RiskRoot causeSafety
OntologyMethodologyReuseSemanticEngineering
Root causeProblem solvingQualityIncident
RiskQualityOperationsRoot cause
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