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Criterion
Design sheets and interface cards connect to jointly written pseudocode with highlighted unresolved questions.
Architecture
ARID (Active Reviews for Intermediate Designs)
Paper illustration of a Test Card with four fields for hypothesis, test, metric, and success threshold.
Product Discovery
Test Card
Paper illustration for Fault Isolation.
Engineering
Fault Isolation
Paper illustration of a Learning Card with four fields for hypothesis, observation, insight, and action.
Product Discovery
Learning Card
Purposedifferent
ARID examines how well developers can work with a technical design. It focuses on a part of the system that can still be revised, between the architecture overview and the detailed specification.The Test Card turns a critical assumption into a testable claim and specifies in advance which result counts as success.In technical failures, the visible symptom often gets mixed up with the actual cause. Fault Isolation narrows the fault space and progressively reduces which part of the system is truly affected.The Learning Card connects traceable test results to a reasoned next action while keeping the limits of the insight visible.
Complexitydifferent
MediumLowMediumLow
Timedifferent
2–4 h review as a planning range; preparation and evaluation additional20-35 min30-180 min25-40 min
Participantsdifferent
Designers, developers as users, and facilitation1-51-61-5
Formatsame
Workshop + asyncWorkshop + asyncWorkshop + asyncWorkshop + async
Outputdifferent
Prioritized development tasks, Jointly produced code or pseudocode, Observed difficulties and open design questions, Proposed design revisionsTest Card with a pre-set thresholdFault Isolation Map, Test Log, Excluded Hypotheses, Narrowed Fault AreaLearning Card with evidence and next action
Tagsno overlap
ArchitectureEngineeringFeedbackValidationTasks
ExperimentsValidationDiscoveryHypothesis
TroubleshootingDiagnosisEngineering
ExperimentsValidationDiscoveryLearning
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