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Criterion
Design sheets and interface cards connect to jointly written pseudocode with highlighted unresolved questions.
Architecture
ARID (Active Reviews for Intermediate Designs)
Paper illustration of a Test Card with four fields for hypothesis, test, metric, and success threshold.
Product Discovery
Test Card
Paper illustration for Fault Isolation.
Engineering
Fault Isolation
Paper illustration for Fake Door Test
Product Discovery
Fake Door Test
Purposedifferent
ARID examines how well developers can work with a technical design. It focuses on a part of the system that can still be revised, between the architecture overview and the detailed specification.The Test Card turns a critical assumption into a testable claim and specifies in advance which result counts as success.In technical failures, the visible symptom often gets mixed up with the actual cause. Fault Isolation narrows the fault space and progressively reduces which part of the system is truly affected.When demand is still unclear, it measures interest in a feature before it is built. It separates real behavior from polite agreement and deliberately keeps build effort small.
Complexitydifferent
MediumLowMediumMedium
Timedifferent
2–4 h review as a planning range; preparation and evaluation additional20-35 min30-180 min1-5 Tage
Participantsdifferent
Designers, developers as users, and facilitation1-51-6Nutzertraffic
Formatdifferent
Workshop + asyncWorkshop + asyncWorkshop + asyncAsync
Outputdifferent
Prioritized development tasks, Jointly produced code or pseudocode, Observed difficulties and open design questions, Proposed design revisionsTest Card with a pre-set thresholdFault Isolation Map, Test Log, Excluded Hypotheses, Narrowed Fault AreaClick Data, Interest Signal, Learning Decision
Tagsno overlap
ArchitectureEngineeringFeedbackValidationTasks
ExperimentsValidationDiscoveryHypothesis
TroubleshootingDiagnosisEngineering
ValidationExperimentsDemandDiscovery
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